报告题目：Post-silicon Functional Validation with Virtual Prototypes
报 告 人：谢飞 博士/副教授（美国波特兰州立大学）
主 持 人：杜承烈 教授
地 点：澳门威尼斯人注册 105学术报告厅
Virtual prototypes are increasingly used to enable shift-left in system development, i.e., early software development before hardware is available. However, the benefits of shift-left will not be fully realized if software does not port readily from virtual prototypes to silicon and system tests are not ready when silicon and software are integrated. Therefore, it is greatly desired that post-silicon functional tests can be generated from virtual prototypes and when these tests are applied over the software and silicon integration, functional differences between virtual prototypes and silicon can be easily uncovered.
In this talk, we present our approach to post-silicon functional validation with virtual prototypes. This approach has three key components: (1) post-silicon functional test coverage analysis with virtual prototypes, (2) automatic concolic test generation from virtual prototypes, and (3) post-silicon conformance checking with virtual prototypes. Application of this approach to real-world silicon devices and their virtual prototypes has led to thousands of automatically generated tests, doubled test coverage in various metrics, and tens of virtual-silicon inconsistencies previously unknown.
Fei Xie is an associate professor in the Department of Computer Science, Portland State University. His research interests are primarily in the areas of embedded systems, software engineering, and formal methods. He is particularly interested in development of formal method based techniques and tools for building safe, secure, and reliable software and embedded systems.